IEC/TR 62258-4-2007 半导体压模产品.第4部分:压模用户和供应商调查表
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【英文标准名称】:Semiconductordieproducts-Part4:Questionnairefordieusersandsuppliers
【原文标准名称】:半导体压模产品.第4部分:压模用户和供应商调查表
【标准号】:IEC/TR62258-4-2007
【标准状态】:作废
【国别】:国际
【发布日期】:2007-08
【实施或试行日期】:
【发布单位】:国际电工委员会(IX-IEC)
【起草单位】:IEC/TC47
【标准类型】:()
【标准水平】:()
【中文主题词】:组件;芯片;消费者与供货者的关系;数据交换;定义;交付;电气工程;电气测量;电子工程;电子设备及元件;环境测试;调查;集成电路;材料;机械测试;半导体装置;半导体;规范(验收);供应;测试;晶片
【英文主题词】:Assemblies;Chips;Components;Consumer-supplierrelations;Dataexchange;Definition;Definitions;Delivery;Electricalengineering;Electricalmeasurement;Electronicengineering;Electronicequipmentandcomponents;Environmentaltesting;Inquiries;Integratedcircuits;Materials;Mechanicaltesting;Semiconductordevices;Semiconductors;Specification(approval);Supplying;Testing;Wafers
【摘要】:ThispartofIEC62258hasbeendevelopedtofacilitatetheproduction,supplyanduseofsemiconductordieproducts,including?wafers;?singulatedbaredie;?dieandwaferswithattachedconnectionstructures;?minimallyorpartiallyencapsulateddieandwafers.Thistechnicalreportcontainsaquestionnaire,basedontherequirementsofotherpartsofIEC62258,whichmaybeusedinnegotiationsandcontractsbetweensuppliersandpurchasersofdiedevices.ItisintendedtoassistallthoseinvolvedinthesupplychainfordiedevicestocomplywiththerequirementsoftheIEC62258-1andIEC62258-2standards.Itshouldberecognizedthatthetablescontainedinthistechnicalreportformachecklistofinformationthatcanpotentiallybesuppliedandthatitmaynotberelevantorpossibletocompleteallfields.Differentmarketsmayrequiredifferentsubsetsoftheinformationrequestedherein.
【中国标准分类号】:L40
【国际标准分类号】:31_080_99;31_200
【页数】:19P.;A4
【正文语种】:英语
【原文标准名称】:半导体压模产品.第4部分:压模用户和供应商调查表
【标准号】:IEC/TR62258-4-2007
【标准状态】:作废
【国别】:国际
【发布日期】:2007-08
【实施或试行日期】:
【发布单位】:国际电工委员会(IX-IEC)
【起草单位】:IEC/TC47
【标准类型】:()
【标准水平】:()
【中文主题词】:组件;芯片;消费者与供货者的关系;数据交换;定义;交付;电气工程;电气测量;电子工程;电子设备及元件;环境测试;调查;集成电路;材料;机械测试;半导体装置;半导体;规范(验收);供应;测试;晶片
【英文主题词】:Assemblies;Chips;Components;Consumer-supplierrelations;Dataexchange;Definition;Definitions;Delivery;Electricalengineering;Electricalmeasurement;Electronicengineering;Electronicequipmentandcomponents;Environmentaltesting;Inquiries;Integratedcircuits;Materials;Mechanicaltesting;Semiconductordevices;Semiconductors;Specification(approval);Supplying;Testing;Wafers
【摘要】:ThispartofIEC62258hasbeendevelopedtofacilitatetheproduction,supplyanduseofsemiconductordieproducts,including?wafers;?singulatedbaredie;?dieandwaferswithattachedconnectionstructures;?minimallyorpartiallyencapsulateddieandwafers.Thistechnicalreportcontainsaquestionnaire,basedontherequirementsofotherpartsofIEC62258,whichmaybeusedinnegotiationsandcontractsbetweensuppliersandpurchasersofdiedevices.ItisintendedtoassistallthoseinvolvedinthesupplychainfordiedevicestocomplywiththerequirementsoftheIEC62258-1andIEC62258-2standards.Itshouldberecognizedthatthetablescontainedinthistechnicalreportformachecklistofinformationthatcanpotentiallybesuppliedandthatitmaynotberelevantorpossibletocompleteallfields.Differentmarketsmayrequiredifferentsubsetsoftheinformationrequestedherein.
【中国标准分类号】:L40
【国际标准分类号】:31_080_99;31_200
【页数】:19P.;A4
【正文语种】:英语
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